RAMAN Spectrometer
Raman Spectroscopy is a non-destructive technique which provides information based on the interaction of light with the chemical bonds and vibrations in a material.
Manufacturing Company : Horiba Scientific
Model : LabRAM HR Evolution
Labram HR UV -VIS- NIR ( 220nm- 2200nm ), with open space microscope, offers a free space under the lens.
You are most welcome to use Raman Spectrometer and also requested to acknowledge the facility with project no. SR/FST/PSI/225/2016 under FIST program of DST whenever the data is published.
Please fill up the required form (Download RAMAN requisition Form link ) and submit a scan copy to Raman Lab ( email:raman-phy@iiti.ac.in ).
Powder X-Ray Diffractometer (P-XRD)
Rigaku SmartLab, Automated Multipurpose x-ray Diffractometer, is an x-ray diffraction system (including thin film analysis system) equipped with a high-accuracy theta-theta goniometer featuring a horizontal sample mount. X-ray diffraction is versatile and non-destructive technique for characterizing the crystalline samples including nano material. It reveals detailed information about phase identification and crystal structure of natural and engineered materials.
Instrument:
Rigaku Smartlab, Automated Multipurpose X-Ray Diffractometer, is an X-ray Diffraction system (including thin film analysis system) equipped with a high-accuracy theta-theta goniometer featuring a horizontal sample mount.
Feature:
- High-accuracy theta-theta goniometer: A theta-theta goniometer enables omega scans, 2-theta/omega scans, and 2-theta scans with the sample oriented horizontally. Additionally, the two axes are equipped with encoders to enable control of each axis with a resolution of 0.0001.
- X-ray generator: A 3 kW sealed tube x-ray generator (Max. voltage 60kV, Max. current 50mA, with Cu target) is attached with this system.
- Cross beam optics (CBO): Changing the selection slits allows easy switching between the direct beam for Para-focusing (Bragg-Brentano or BB) optics and a monochromatic parallel using a multilayer mirror. Para-focusing optics is applied to the measurement of phase ID analysis and quantitative analysis of powder samples. Parallel beam (PB) optics is applied to the measurement of profile analysis of powder samples, measurement of preferred orientation, measurement of thin film samples, and rocking curve measurement.
- Detectors:
(i) 0D Scintillation Counter (point detector),
(ii)1D Semiconductor Detector D/tex Ultra (linear detector)
Sample Specification:
Only Solid and Powder samples can be performed. Finely grinded powder with sample in sufficient quantity (2 gm) should be brought/Send to the XRD Lab. The samples should be submitted in the prescribed label cover. Scans with angle of 2° or above can be performed.
All concern persons, research fellows and students are advised to send their application and samples through their supervisors or Head of Department. The request should be made only on University/College/Institute letter head.
Charges for Powder XRD :
The charges for the X-Ray Diffraction analysis are as under:
For internal users (IIT Indore) Rs. 50/-per sample per hour
For users from Govt. Educational Institutes &Labs Rs. 2000/-– per sample per hour
For users from Industry & Private Institute, Rs. 5000/--per sample per hour
Please add service tax @ 12.36% in the above rate list
Please add courier charges of Rs.100.(optional)
The charges for external users have to be paid at the time of sample submission. All payments should be made in the form of a demand draft (DD) in favour of “Registrar, Indian Institute of Technology Indore” payable at Indore and the payment should be sent to-
Faculty in Charge: Dr. Sudeshna Chattopadhyay
Associate Professor
WS-213, Workshop Building,
IIT INDORE, Khandwa Road,
Simrol, INDORE
Email: sudeshna@iiti.ac.in
Phone: +91 7324 306544
Pulse Layer deposition set up:
Pulse layer deposition set up is an advanced research facility at IIT Indore used to fabricate thin films.
Contact Details:
Faculty in Charge: Dr. Krushna Mavani
Discipline of Physics
Email: sudeshna@iiti.ac.in
Phone: +91 7324 306923
X-ray Absorption(XAS)for the measurement of XANES and EXAFS:
What Xanes and EXAFS do?
- Element Specific: K edges of all elements from Ti to Cu can be measured.
- Samples: Crystallinity is not required — amorphous, nano, soils, films
- Valence Probe: Gives chemical state and formal valence of selected element
- Local Structure: bond -distance and number of near-neighbor atoms around selected element
Atomic Layer Deposition (ALD) :
Equipment: TFS 200, BENEQ: Atomic Layer Deposition (ALD), as a thin film coating method.
Contact Details:
Faculty in Charge: Dr. Sudeshna Chattopadhyay
Discipline of Physics
Email: sudeshna@iiti.ac.in
Phone: +91 7324 306544
Energy storage laboratory: Battery research :
Contact Details:
Faculty in Charge: Sudeshna Chattopadhyay
Discipline of Physics
Email: sudeshna@iiti.ac.in
Phone: +91 7324 306544
Glove box for battery research: Mbraun UniLab :
Contact Details:
Faculty in Charge: Sudeshna Chattopadhyay
Discipline of Physics
Email: sudeshna@iiti.ac.in
Phone: +91 7324 306544
