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School of Basic Sciences
Discipline of Physics

© Discipline of Physics, Indian Institute of Technology Indore
Research Facilities

Powder X-Ray Diffractometer (P-XRD)

X-ray diffraction is versatile and non-destructive technique for characterizing the crystalline samples including nano material. It reveals detailed information about phase identification and crystal structure of natural and engineered materials.

Instrument:

Rigaku Smartlab, Automated Multipurpose X-Ray Diffractometer, is an X-ray Diffraction system (including thin film analysis system) equipped with a high-accuracy theta-theta goniometer featuring a horizontal sample mount.




Feature:

  • High-accuracy theta-theta goniometer:
    A theta-theta goniometer enables omega scans, 2-theta/omega scans, and 2-theta scans with the sample oriented horizontally. Additionally, the two axes are equipped with encoders to enable control of each axis with a resolution of 0.0001.

  • Attachments:
    Standard Powder XRD attachment, RxRy attachment (for sample tilt alignment, for thin film and rocking curve measurement), Phi-Chi attachment (for thin film, reflectivity).

  • X-ray generator:
    A 3 kW sealed tube x-ray generator (Max. voltage 60kV, Max. current 50mA, with Cu target) is attached with this system.

  • Cross beam optics (CBO):
    Changing the selection slits allows easy switching between the direct beam for Para-focusing (Bragg-Brentano or BB) optics and a monochromatic parallel using a multilayer mirror. Para-focusing optics is applied to the measurement of phase ID analysis and quantitative analysis of powder samples. Parallel beam (PB) optics is applied to the measurement of profile analysis of powder samples, measurement of preferred orientation, measurement of thin film samples, and rocking curve measurement.

  • Detectors:
    (i) 0D Scintillation Counter (point detector),
    (ii)1D Semiconductor Detector D/tex Ultra (linear detector)

Sample Specification:

Only Solid and Powder samples can be performed. Finely grinded powder with sample in sufficient quantity (2 gm) should be brought/Send to the XRD Lab. The samples should be submitted in the prescribed label cover. Scans with angle of 2° or above can be performed.

All concern persons, research fellows and students are advised to send their application and samples through their supervisors or Head of Department. The request should be made only on University/College/Institute letter head.

Charges for Powder XRD :

The charges for the X-Ray Diffraction analysis are as under:
For internal users (IIT Indore) Rs. 50/-per sample per hour
For users from Govt. Educational Institutes &Labs Rs. 2000/- per sample per hour
For users from Industry & Private Institute, Rs. 5000/-per sample per hour
Please add service tax @ 12.36% in the above rate list
Please add courier charges of Rs.100.(optional)

The charges for external users have to be paid at the time of sample submission. All payments should be made in the form of a demand draft (DD) in favour of "Registrar, Indian Institute of Technology Indore" payable at Indore and the payment should be sent to-

Dr. Sudeshna Chattopadhyay
Assistant Professor
WS-213, Workshop Building,
IIT INDORE, Khandwa Road,
Simrol, INDORE
Email: sudeshna@iiti.ac.in
Phone: +91 731 2438 936/959

Download P-XRD Form link


Pulse Laser Deposition Setup